BS IEC 62047‑32:2019 pdf download – Semiconductor devices — Micro- electromechanical devices Part 32: Test method for the nonlinear vibration of MEMS resonators.
1 Scope This part of IEC 62047 specifies the test method and test condition for the nonlinear vibration of MEMS resonators. The statements made in this document apply to the development and manufacture for MEMS resonators. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 62047-1 , Semiconductor devices – Micro-electromechanical devices – Part 1: Terms and definitions 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 62047-1 and the following apply. • IEC Electropedia: available at http://www.electropedia.org/ • ISO Online browsing platform: available at http://www.iso.org/obp 3.1 nonlinear vibration vibration whose displacement has a nonlinear relationship with the elastic restoring force, with the change of the vibration amplitude 3.2 nonlinear jump jump phenomenon of the frequency response curve when the vibration amplitude exceeds a certain threshold 3.3 frequency deviation deviation of the vibration frequency of the resonator in a closed-loop system from the natural frequency of the resonator 4 Test parameters of nonlinear vibration of the resonators Test parameters of nonlinear vibration of the resonators are: a) amplitude-frequency response of the nonlinear vibration, ( ) A ω ; b) phase-frequency response of the nonlinear vibration, ( ) P ω ;
c) bending factor of the amplitude-frequency response, b ; d) amplitude threshold for the nonlinear jump, c a ; e) frequency deviation of the self-exciting closed-loop system, 1 E ; f) frequency deviation of the phase-locked closed-loop system, 2 E ; g) frequency deviation of the burst-exciting closed-loop system, 3 E . 5 Test method for the amplitude-frequency response and phase-frequency response of the nonlinear vibration 5.1 Test system A test system consists of the following equipments: a) laser vibrometer; b) micro-optical apparatus; c) signal generator; d) vacuum chamber; e) mounting fixture; f) vacuum pump; g) angle valve. The test system is illustrated in Figure 1 .
f) For out-of-plane vibrating resonators, the surface of the installing base should be parallel to the horizontal plane. For in-plane vibrating resonators, the surface of the installing base should be set to a certain angle about the horizon level, to ensure enough intensity of the reflected laser into the detector. g) The vacuum pump and the vacuum chamber should be connected with flexible bellows in case of the vibration propagation from the pump to the chamber. h) The angle valve should be tightly shut off to well maintain the vacuum level, and then the pump turned off before operating the test procedure. 5.3 Test procedures a) Set the frequency of the vibration excitation according to the estimated value of the natural frequency of the resonator. And then implement the initial frequency scan around the natural frequency within a wide range. The amplitude frequency response and the phase frequency response can be measured according to the vibration displacement of the resonators. And record the resonant frequency of the resonator. b) Reset the vibration excitation parameters to implement the frequency scan for the second time: reducing the interval of the frequency scan to half of that set in the initial frequency scan and reducing the range of the frequency scan to ten times of the half-power bandwidth of the amplitude frequency response. The amplitude frequency response and the phase frequency response can be measured according to the vibration displacement of the resonators. And record the resonant frequency of the resonator. c) Compare the resonant frequencies obtained by the initial and the second tests. If the discrepancy in the resonant frequencies is smaller than 1 ppm 1 of the resonant frequency measured in the second test, either the initial or the second test result can be deemed as the accurate amplitude frequency response and the phase frequency response.
BS IEC 62047‑32:2019 pdf download – Semiconductor devices — Micro- electromechanical devices Part 32: Test method for the nonlinear vibration of MEMS resonators
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