IEC 63185:2020 pdf download – Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

03-04-2022 comment

IEC 63185:2020 pdf download – Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method.
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) 3) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) 5) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
1 Scope This document relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis. In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3, this method has the following characteristics: • the values of the relative permittivity ε r ’ and loss tangent tanδ normal to dielectric plate samples can be measured accurately and non-destructively; • • this method presents broadband measurements by using higher-order modes by one resonator; this method is applicable for the measurements on the following condition: – frequency: 10 GHz ≤ f ≤ 110 GHz; – relative permittivity: 1 ≤ ε r ’ ≤ 10; – loss tangent: 10 –4 ≤ tanδ ≤ 10 –2 . 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61338-1-3:1999, Waveguide type dielectric resonators – Part 1-3: General information and test conditions – Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency IEC 62810:2015, Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods 3 Terms and definitions No terms and definitions are listed in this document.
5 Theory and calculation equations A resonator structure used in this method is shown in Figure 1. A thin circular conductor disk with radius R is sandwiched between a pair of dielectric plate samples to be measured having the same thickness t and dielectric properties ε r ‘ and tan δ. Dielectric samples are sandwiched by two parallel conductor plates. The thickness of the conductor disk is negligibly thin in the analysis. The resonator is excited and detected by coaxial lines through excitation holes having radius a and length M. Because only the TM 0m0 modes have the electric field in the center of the resonator, only those modes are selectively excited in the resonator, where the electric field components in the resonator are normal to the plate samples for those modes.

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