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BS IEC 62047-31:2019 pdf download – Semiconductor devices – Micro- electromechanical devices Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials IEC standards download

BS IEC 62047-31:2019 pdf download – Semiconductor devices – Micro- electromechanical devices Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials

BS IEC 62047-31:2019 pdf download - Semiconductor devices - Micro- electromechanical devices Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials. 1 Scope This part of IEC 62047 specifies a four-point bending...
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